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MPI Probers :


Applications :

Device Characterization for Modeling and Process Development :

They may be configured to support a wide variety of applications such as failure analysis, design and engineering validation, wafer level reliability, MEMS, high power and device characterization and modeling as well.


MPI Manual probe systems :

Manual probers :

These manual probers are designed for the precise analysis of substrates and wafers up to 150, 200 and 300 mm.

Applications : DC, RF, HP, ...
From wafer 50 mm until 300 mm with or without thermal chuck.
DC and RF positioners,
Dedicated probe arms for DC/CV and RF measurements,
Microscope or camera optics, ...


MPI automated probe systems :

Semi-automatic probers :

These semi-automatic probers are designed for the precise analysis of substrates and wafers up to 200 or 300 mm.

Applications : MEMS, High Power, RF et mmW.
SE Version : EMI-shielded and light-tight test environment,
Thermal chuck from -60°C until +300°C,
DC and RF positioners,
Dedicated probe arms for DC/CV and RF measurements,
Camera optics, ...

MPI fully automatic probe systems :

Fully automatic probers :

TS2500 probers are used for the production test of high power RF communication components.
TS3500 probers have automatic wafer loading.




Download the data sheet :


Applications :

Full models :
+33(0)4 90 40 60 90
+33(0)4 90 40 61 05 (FAX)



ZA la Garrigue du Rameyron
84830 Serignan-Du-Comtat
FRANCE
Lun-Ven : 08h30 - 17h00
microtest@microtest-semi.com

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